Month: January 2023

Real-space imaging of polar and elastic nano-textures in thin films via inversion of diffraction data
Z. Shao, N. Schnitzer, J. Ruf, O. Y. Gorobtsov, C. Dai, B. H. Goodge, T. Yang, H. Nair, V. A. Stoica, J. W. Freeland, J. Ruff, L.-Q. Chen, D. G. Schlom, K. M. Shen, L. F. Kourkoutis, A. Singer
arXiv:2211.01506

Emergence of Layer Stacking Disorder in c-axis Confined MoTe₂
J. L. Hart, L. Bhatt, Y. Zhu, M.-G. Han, E. Bianco, S. Li, D. J. Hynek, J. A. Schneeloch, Y. Tao, D. Louca, P. Guo, Y. Zhu, F. Jornada, E. J. Reed, L. F. Kourkoutis, J. J. Cha
arXiv:2210.16390