Real-space imaging of polar and elastic nano-textures in thin films via inversion of diffraction data
Z. Shao, N. Schnitzer, J. Ruf, O. Y. Gorobtsov, C. Dai, B. H. Goodge, T. Yang, H. Nair, V. A. Stoica, J. W. Freeland, J. Ruff, L.-Q. Chen, D. G. Schlom, K. M. Shen, L. F. Kourkoutis, A. Singer
arXiv:2211.01506
Real-space imaging of polar and elastic nano-textures in thin films via inversion of diffraction data