Real-space imaging of polar and elastic nano-textures in thin films via inversion of diffraction data
Real-space imaging of polar and elastic nano-textures in thin films via inversion of diffraction data
Z. Shao, N. Schnitzer, J. Ruf, O. Y. Gorobtsov, C. Dai, B. H. Goodge, T. Yang, H. Nair, V. A. Stoica, J. W. Freeland, J. Ruff, L.-Q. Chen, D. G. Schlom, K. M. Shen, L. F. Kourkoutis, A. Singer
arXiv:2211.01506