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Atomic-resolution spectroscopic imaging of oxide interfaces

REDES January 26, 2021 Publications

Atomic-resolution spectroscopic imaging of oxide interfaces
L. Fitting Kourkoutis, H. L. Xin, T. Higuchi, Y. Hotta, J. H. Lee, Y. Hikita, D. G. Schlom, H. Y. Hwang, D. A. Muller
Phil. Mag. 90, 4731-4749 (2010)

Atomic-resolution spectroscopic imaging of oxide interfaces
Tagged on: 2010
  • ← Magnetism at spinel thin film interfaces probed through soft x-ray spectroscopy techniques
  • Controlled synthesis of uniform cobalt phosphide hyperbranched nanocrystals using tri-n-octylphosphine oxide as a phosphorus source →

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