Electron microscopic imaging of an ion beam mixed SiO2/Si interface correlated with photo- and cathoduluminescence

Chris Lastovicka January 26, 2021January 26, 2021 Publications

Electron microscopic imaging of an ion beam mixed SiO₂/Si interface correlated with photo- and cathoduluminescence
H.-J. Fitting, L. Fitting Kourkoutis, B. Schmidt, B. Liedke, E. V. Ivanova, M. V. Zamoryanskaya, V. A. Pustovarov, A. F. Zatsepin
Phys. Stat. Sol. A 209, 1101-1108 (2012)

Electron microscopic imaging of an ion beam mixed SiO2/Si interface correlated with photo- and cathoduluminescence

Tagged on: 2012