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Electron microscopic imaging of an ion beam mixed SiO2/Si interface correlated with photo- and cathoduluminescence

Chris Lastovicka January 26, 2021January 26, 2021 Publications

ion beam mixed SiO2/Si interfaceElectron microscopic imaging of an ion beam mixed SiO2/Si interface correlated with photo- and cathoduluminescence
H.-J. Fitting, L. Fitting Kourkoutis, B. Schmidt, B. Liedke, E. V. Ivanova, M. V. Zamoryanskaya, V. A. Pustovarov, A. F. Zatsepin
Phys. Stat. Sol. A 209, 1101-1108 (2012)

Electron microscopic imaging of an ion beam mixed SiO2/Si interface correlated with photo- and cathoduluminescence
Tagged on: 2012
  • ← Atomic-resolution spectroscopic imaging of ensembles of nanocatalyst particles across the life of a fuel cell
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