Epitaxial integration of the highly spin-polarized ferromagnetic semiconductor EuO with silicon and GaN
A. Schmehl, V. Vaithyanathan, A. Herrnberger, S. Thiel, C. Richter, M. Liberati, T. Heeg, M. Röckerath, L. Fitting Kourkoutis, S. Mühlbauer, P. Böni, D. A. Muller, Y. Barash, J. Schubert, Y. Idzerda, J. Mannhart, D. G. Schlom
Nature Mater. 6, 882-887 (2007)

Superconducting interfaces between insulating oxides
N. Reyren, S. Thiel, A. D. Caviglia, L. Fitting Kourkoutis, G. Hammerl, C. Richter, C. W. Schneider, T. Kopp, A.-S. Rüetschi, D. Jaccard, M. Gabay, D. A. Muller, J.-M. Triscone, J. Mannhart
Science 317, 1196-1199 (2007)

Asymmetric interface profiles in LaVO3/SrTiO3 heterostructures grown by pulsed laser deposition
L. Fitting Kourkoutis, Y. Hotta, H. Y. Hwang, D. A. Muller
Appl. Phys. Lett. 91, 163101.1-3 (2007)

Luminescence of isoelectronically ion-implanted SiO2 layers
R. Salh, L. Fitting Kourkoutis, B. Schmidt, H.-J. Fitting 
Phys. Stat. Sol. A 204, 3132-3144 (2007)

Si and Ge nanocluster formation in silica matrix
R. Salh, L. Fitting, E. V. Kolesnikova, A. A. Sitnikova, M. V. Zamoryanskaya, B. Schmidt, H.-J. Fitting
Semiconductors 41, 381-386 (2007)

Nanometer Scale electronic reconstraction at the interface between LaVO3 and LaVO4
L. Fitting Kourkoutis, Y. Hotta, T. Susaki, H. Y. Hwang, D. A. Muller
Phys. Rev. Lett. 97, 256803.1-4 (2006)

Growth and epitaxial structure of LaVOx films
Y. Hotta, Y. Mukunoki, T. Susaki, H. Y. Hwang, L. Fitting, D. A. Muller
Appl. Phys. Lett. 89, 031918.1-3 (2006)

Subtleties in ADF imaging and spatially resolved EELS: A case study of low-angle twist boundaries in SrTiO3 
L. Fitting, S. Thiel, A. Schmehl, J. Mannhart, D. A. Muller
Ultramicroscopy 106, 1053-1061 (2006)

Room design for high-performance electron microscopy
D. A. Muller, E. J. Kirkland, M. G. Thomas, J. L. Grazul, L. Fitting, M. Weyland
Ultramicroscopy 106, 1033-1040 (2006)

Self-organized nanoscale Ge dots and dashes on SiGe/Si superlattices
L. Fitting, M. E. Ware, J. R. Haywood, J. J. H. Walter, R. J. Nemanich
J. Appl. Phys. 98, 024317.1-6 (2005)


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